@Article{electronics4010150,
AUTHOR = {Bai, Yu and Alawad, Mohammed and DeMara, Ronald F. and Lin, Mingjie},
TITLE = {Optimally Fortifying Logic Reliability through Criticality Ranking},
JOURNAL = {Electronics},
VOLUME = {4},
YEAR = {2015},
NUMBER = {1},
PAGES = {150--172},
URL = {http://www.mdpi.com/2079-9292/4/1/150},
ISSN = {2079-9292},
DOI = {10.3390/electronics4010150}
}