@Article{jlpea5010003,
AUTHOR = {Alawad, Mohammed and DeMara, Ronald F. and Lin, Mingjie},
TITLE = {Stochastically Estimating Modular Criticality in Large-Scale Logic Circuits Using Sparsity Regularization and Compressive Sensing},
JOURNAL = {Journal of Low Power Electronics and Applications},
VOLUME = {5},
YEAR = {2015},
NUMBER = {1},
PAGES = {3--37},
URL = {http://www.mdpi.com/2079-9268/5/1/3},
ISSN = {2079-9268},
DOI = {10.3390/jlpea5010003}
}