Abstract— Self-repair is an intriguing option, especially for applications which involve autonomous operation and where human intervention is impossible, e.g. space electronics. This work looks to mitigate the effects of aging induced hard faults in commercial off the shelf SRAM-based Field Programmable Gate Arrays (FPGAs) at application level using an evolutionary inspired technique. Results show refurbishment of circuits with tile sizes up to 148 LUTs and in the presence of multiple faults. Further, the effect of increasing output lines for a given tile is also to be investigated on the proposed refurbishment technique.