R. S. Oreifej, C. A. Sharma, and R. F. DeMara, "Expediting 
GA-Based Evolution Using Group Testing Techniques for 
Reconfigurable Hardware," in Proceedings of the IEEE 
International Conference on Reconfigurable Computing and 
FPGAs (Reconfig'06), San Luis Potosi, Mexico, 
September 20-22, 2006, pp 106-113.

Abstract:
    Autonomous      repair     and    refurbishment      of
reprogrammable logic devices using Genetic Algorithms
can improve the fault tolerance of remote mission-critical
systems. The goal of increasing availability by minimizing
the repair time is addressed in this paper using a CGT-
pruned Genetic Algorithm. The proposed method utilizes
resource performance information obtained using
Combinatorial Group Testing (CGT) techniques to evolve
refurbished configurations in fewer generations than
conventional genetic algorithms. A 3-bit x 2-bit Multiplier
circuit was evolved using both conventional and CGT-
pruned genetic algorithms. Results show that the new
approach yields completely refurbished configurations
37.6% faster than conventional genetic algorithms. In
addition it is demonstrated that for the same circuit,
refurbishment of partially-functional configurations is a
more tractable problem than designing the configurations
when using genetic algorithms as results show the former
to take 80% fewer generations.